Thermal Management (thermal-management)
Purpose
Combine parallel conduction, convection, radiation, and coolant flow estimates for steady-state heat rejection from electronics, cold plates, and advanced hardware. Reports effective thermal resistance and coolant temperature rise.
Physics & theory
Heat flows through parallel paths from hot surface at to ambient. Conduction through solid: . Convection to fluid or air: . Radiation: .
Total capacity (screening sum). Effective resistance . Coolant mass flow required: .
Advanced systems calculators use lumped-parameter screening models suitable for concept trade studies. Each calculator returns explicit assumptions and warnings arrays documenting model limits. Constants such as ( sigma ) (Stefan–Boltzmann), ( mu_0 ), and ( R ) (gas constant) use SI definitions from the solver source.
Results are not certified for regulatory submission without independent verification against detailed analysis or test data.
Governing equations
Numerical method
Parallel path capacity summation (advanced-systems/calculators). Paths treated as independent capacity estimates — not series thermal network unless user configures equivalent .
Inputs
| Parameter | Description |
|---|---|
deltaT, area | Driving potential and area |
thickness, conductivity | Conduction path |
convectionCoefficient | (W/m²·K) |
emissivity, hotTemperature, ambientTemperature | Radiation |
flowRate, coolantCp | Liquid cooling |
Outputs
- Conduction, convection, radiation components (W), total capacity, thermal resistance (K/W), coolant rise (K).
Design codes & checks
- Indicative: Heat-transfer capacity, thermal resistance screening
- JEDEC: Electronics thermal practice (context)
- ASHRAE: Heat transfer data (reference)
Assumptions & limitations
- Steady-state lumped model; no transient or spatial gradients.
- Parallel path summation may overestimate if paths are actually series-dominated.
- No spreading resistance, contact interface resistance, or two-phase boiling.
- CFD and fin efficiency not computed.
References
- Incropera, F. P., et al. Fundamentals of Heat and Mass Transfer, 8th ed.
- JEDEC JESD51 series. Thermal characterization of semiconductor devices.
- ASHRAE Handbook — Fundamentals.
- Lee, S. Optimum Design and Selection of Heat Sinks. IEEE Trans. COM-25.
- PhyCalcPro verification benchmarks in
src/data/verification/where available for this module. - Beer, F. P., et al. Mechanics of Materials, 8th ed. McGraw-Hill — foundational stress and deformation theory.